特性
- Four Matched Sample-and-Hold Amplifiers
- Independent Inputs, Outputs and Control Pins
- 500 µs Hold Mode Settling
- 1 µs Maximum Acquisition Time to 0.01%
- Low Droop Rate: 0.01 µV/µs
- Internal Hold Capacitors
- 75 ps Maximum Aperture Jitter
- Low Power Dissipation: 430 mW
- 0.3" Skinny DIP Package
- MIL-STD-883 Compliant Versions Available
AD684是一款单芯片四通道采样保持放大器(SHA)。它具有四个完整的采样通道，各通道均由独立的保持命令控制。每个SHA都配有内部保持电容。高精度SHA通道独立自足，无需外部器件或调整。AD684采用BiMOS工艺制造，集高性能双极性电路与低功耗CMOS逻辑于一体。
AD684是高性能、多通道数据采集系统的理想之选。每个SHA通道都能在不到1 µs的时间内采集一个信号，保持值的下降率低于0.01 µV/µs。出色的线性度和交流性能使它成为高速12位和14位ADC的理想前端。
AD684采用自校正架构，能够将保持模式误差降至低点，并确保器件整个温度范围内都能提供高精度。AD684的每个通道都能提供5 mA源电流，并集成了输出短路保护功能。
AD684提供三种温度范围。J级器件的额定工作温度范围为0至+70°C，A级为-40°C至+85°C，S级为-55°C至+125°C。
数据手册 1
ADI 始终高度重视提供符合最高质量和可靠性水平的产品。我们通过将质量和可靠性检查纳入产品和工艺设计的各个范围以及制造过程来实现这一目标。出货产品的“零缺陷”始终是我们的目标。查看我们的 质量和可靠性计划和认证 以了解更多信息。
| 产品型号 | 引脚/封装图-中文版 | 文档 | CAD 符号，脚注和 3D模型 |
|---|---|---|---|
| 5962-9201301MEA |
16-Lead CerDIP
|
|
|
| AD684AQ |
16-Lead CerDIP
|
|
|
| AD684JQ |
16-Lead CerDIP
|
|
|
| AD684SQ |
16-Lead CerDIP
|
|
|
| AD684SQ/883B |
16-Lead CerDIP
|
|
根据型号筛选
重置过滤器
产品型号
产品生命周期
PCN
4月 9, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
5962-9201301MEA
AD684SQ/883B
11月 7, 2012
- 12_0199
Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
5962-9201301MEA
AD684AQ
AD684JQ
AD684SQ
AD684SQ/883B
6月 6, 2012
- 12_0066
Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
5962-9201301MEA
AD684SQ/883B
11月 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
5962-9201301MEA
AD684AQ
AD684JQ
AD684SQ
AD684SQ/883B
11月 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines
5962-9201301MEA
AD684AQ
AD684JQ
AD684SQ
AD684SQ/883B
根据型号筛选
重置过滤器
产品型号
产品生命周期
PCN
4月 9, 2018
- 16_0026
Qualify TeamQuest Technology, Inc. for Burn-in and Life Test of Military and Aerospace Devices
11月 7, 2012
- 12_0199
Qualification of New Conductive Silver-Filled Glass Die Attach Adhesive for Cerdip and Ceramic Flatpack (Cerpack) Packages.
5962-9201301MEA
AD684AQ
AD684JQ
AD684SQ
AD684SQ/883B
6月 6, 2012
- 12_0066
Add capacity for Burn In of Hermetic, 883 & QMLQ/Class B devices at TSSI Cavite
5962-9201301MEA
AD684SQ/883B
11月 9, 2011
- 11_0050
Transfer of ADI Hermetics Assembly location from Paranaque, Manila to General Trias, Cavite Philippines
11月 9, 2011
- 11_0182
Test Site Transfer from Analog Devices Philippines Inc in Paranaque to Analog Devices General Trias in Cavite, Philippines