1. AABUS: As Agreed Upon Between User and Supplier 由供需双方协商确定
2. ASIC: Applications Specific IC 专用集成电路
3. ASM: Array Surface Mount 阵列表面贴装
4. ASMP: Application Specific Module Packaging 专用模块封装
5. AXI: Automatic X-Ray Inspection 自动X射线检查
6. BGA: Ball Grid Array 球栅阵列
7. BOC: Board-On-Chip 芯片上板子直装
8. BT: Bismaleimide-Triazine 双马来酰亚胺三嗪
9. CAGE: Commercial and Government Entity 商业及政府机构
10. CBGA: Ceramic Ball Grid Array 陶瓷球栅阵列
11. CCGA: Ceramic Column Grid Array 陶瓷柱栅阵列
12. CGA: Column Grid Array 柱栅阵列
13. COB: Chip-On-Board 板上芯片直装
14. CPU: Central Processing Unit 中央处理器
15. CSP: Chip Scale Packages 芯片尺寸封装
16. CTE: Coefficient of Thermal Expansion 热膨胀系数
17. CTF: Critical To Function 关键功能
18. DBDPE: Decabromodiphenyl Ether 十溴联苯醚
19.DDR-SDRAM: Double-Data-Rate Synchronous Dynamic Random Access Memory 双倍速率同步动态随机存取存储器
20.Df: Dissipation Factor 损耗因子
21.DfM: Design for Manufacturability 可制造性设计
22.DfR: Design for Reliability 可靠性设计
23. DIG: Direct Immersion Gold 直接浸金
24. Dk: Dielectric Constant 介电常数
25. DMA: Dynamic Mechanical Analysis 动态力学分析
26. DSBGA: Die-Size Ball Grid Array 芯片尺寸球栅阵列
27. DSC: Differential Scanning Calorimetry 差分扫描热量测定法
28. DSP: Die Size Package 芯片尺寸封装
29. dT: Temperature Differential 温差
30. ECM: Electrochemical Migration Test 电化学迁移测试
31. ENEPIG: Electroless Nickel/Electroless Palladium/Immersion Gold 化学镀镍/化学镀钯/浸金
32. ENIG: Electroless Nickel Immersion Gold 化学镀镍浸金
33. ESD: Electrostatic Discharge/ Electrostatic Device 静电放电/静电装置
34. ESS: Environmental Stress Screening 环境应力筛选
35. EU: European Union 欧盟
36. FAT: Flux Activation Time 助焊剂活化时间
37. FBGA: Fine Pitch Ball Grid Array 密节距球栅阵列
38. FC: Flip Chip 倒装芯片
39. FPT: Fine Pitch Technology 密节距技术
40. FRBGA: Fine-Pitch, Rectangular Ball Grid Array 密节距,矩形球栅阵列
41. FT: Functional Test 功能测试
42. GAC: Grid Array Component 格栅阵列器件
43. HASL: Hot Air Solder Level 热风焊料整平
44. HAST: Highly Accelerated Stress Testing 高加速应力测试
45. HCI: Hydrochloric 氯化氢的
46. HDB: High Density Printed Boards 高密度印制板
47. HF: Hydrofluoric 氢氟酸的
48. HoP: Head-on-Pillow 枕头效应
49. I/O: Input/Output 输入/输出
50. ICT: In-Circuit Test 在线测试
51. ILC: Independent Loading Mechanism 独立加载机构
52. IMC: Intermetallic Compound 金属间化合物
53. IR: Infrared 红外线
54. LCP: Liquid Crystal Polymer 液晶聚合物
55. LFBGA: Low-Profile Fine-Pitch Ball Grid Array 小外形密节距球栅阵列
56. LMC: Least Material Condition 最小实体条件
57. LTD: Liquidus Time Delay 液相时间延迟
58. MCM: Multichip Module 多芯片模块
59. MCM-L: Multichip Module-Laminate 多芯片模块-层压板
60. MCP: Multichip Package 多芯片封装
61. MD: Metal Defined 金属限定
62. MDA: Manufacturing Defect Analyzer 制造缺陷分析仪
63. MDS: Multi Device Subassembly 多器件子组件
64. MLC: Multilayer Ceramic 多层陶瓷
65. MMB: Moisture Membrane Bag 湿薄膜袋
66. MMC: Maximum Material Condition 最大实体条件
67. NAND: Not “And” 非“与”
68.NSMD: Nonsolder Mask Defined 非阻焊膜限定
69. OEM: Original Equipment Manufacturer 原始设备制造商
70. OSP: Organic Solderability Preservative 有机可焊性保护剂
71. PBB: Polybrominated Biphenyl 多溴化联苯
72. PBBO: Polybrominated Biphenyl Oxide 多溴化联苯氧化物
73. PBDE: Polybrominated Diphenyl Ether 多溴二苯醚
74. PBGA: Plastic Ball Grid Array 塑封球栅阵列
75. PCA: Printed Circuit Assembly 印制电路组件
76. PCB: Printed Circuit Board 印制电路板
77. PCM: Phase Change Materials 相变材料
78. PCMCIA: Personal Computer Memory Card International Association 个人计算机存储卡国际协会
79. PGA: Pin Grid Array 针栅阵列
80. PLCC: Plastic Leaded Chip Carrier 塑料有引线芯片载体
81. PSA: Pressure Sensitive Adhesives 压敏粘合剂
82. PTH: Plated Through-Hole 镀通孔
83. QFP: Quad Flat Pack 方形扁平封装
84. RDS: Rectangular Die Size 矩形芯片尺寸
85. RF: Radio Frequency 射频
86. RFID: Radio Frequency Identification 射频识别
87. RMS: Root Mean, Square 均方根
88. RoHS: Restriction of Hazardous Substances 有害物质限制
89. RSS: Ramp-Soak-Spike 升温-保温-峰值
90. RTS: Ramp-to-Spike 升温至峰值
91. SAC: Sn/Ag/Cu 锡/银/铜
92. SDRAM: Synchronous Dynamic Random Access Memory 同步动态随机访问存储器
93. SGA: Solder Grid Array 焊料栅格阵列
94. SIR: Surface Insulation Resistance 表面绝缘电阻
95. SMD: Solder Mask Defined 阻焊膜限定
96. SMOBC: Solder Mask Over Bare Copper 裸铜覆阻焊膜
97. SMT: Surface Mounting Technology 表面贴装技术
98. SO-DIMM: Small Outline Dual In-Line Memory Module 小外形双列直插存储模块
99. SOIC: Small Outline Integrated Circuit 小外形集成电路
100. SPC: Statistical Process Control 统计过程控制
101. SRAM: Static Random Access Memory 静态随机存取存储器
102. SSO: Simultaneously Switching Output 同步开关输出
103. STII: Soldering Temperature Impact Index 焊接温度影响指数
104. TAB: Tape-Automated Bonding 载带自动键合
105. TAL: Time Above Liquidus 液相线上时间
106. TBBPA: Tetrabromobisphenol A 四溴双酚A
107. TBGA: Tape Ball Grid Array 载带球栅阵列
108. Td: Decomposition Temperature 分解温度
109. TFBGA: Thin Profile Fine Pitch Ball Grid Array 薄外形细节距球栅阵列
110. Tg: Transition Temperature 转变温度
111. TIM: Thermal Interface Materials 热界面材料
112. TMA: Thermal Mechanical Analysis 热机械分析
113. UFPT: Ultra Fine Pitch Technology 超密节距技术
114. UtRAM: Uni-transistor Random Access Memory 单一晶体管随机存取存储器
115. UUT: Unit Under Test 被测单元
116. UV: Ultraviolet 紫外线
117. VFBGA: Very Thin-Profile Fine-Pitch Ball Grid Array 极薄外形细节距球栅阵列
118. WEEE: Waste in Electrical and Electronic Equipment 废弃电子电器设备
119. ZIF: Zero Insertion Force 零插拔力
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